Author:Eric Hatfield, M.D.1; Agus Priatna, Ph.D.2; John Kotyk, Ph.D.1; Benjamin Tan, M.D.1; Alto Stemmer2; Stephan Kannengiesser, Ph.D.2; Vamsi Narra, M.D.1
1Mallinckrodt Institute of Radiology, St. Louis, USA; 2Siemens Healthcare
Authored date:2009-08-25